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79C2040BRT4RFK-15 PDF预览

79C2040BRT4RFK-15

更新时间: 2024-01-29 06:01:31
品牌 Logo 应用领域
麦斯威 - MAXWELL 可编程只读存储器电动程控只读存储器电可擦编程只读存储器内存集成电路
页数 文件大小 规格书
17页 378K
描述
EEPROM,

79C2040BRT4RFK-15 技术参数

生命周期:Active包装说明:FLATPACK-100
Reach Compliance Code:compliant风险等级:5.59
最长访问时间:150 ns数据轮询:YES
数据保留时间-最小值:10耐久性:10000 Write/Erase Cycles
JESD-30 代码:R-XDFP-F100长度:34.6964 mm
内存密度:20971520 bit内存集成电路类型:EEPROM
内存宽度:40功能数量:1
端子数量:100字数:524288 words
字数代码:512000工作模式:ASYNCHRONOUS
最高工作温度:125 °C最低工作温度:-55 °C
组织:512KX40封装主体材料:UNSPECIFIED
封装代码:DFP封装等效代码:FL100,.9,25
封装形状:RECTANGULAR封装形式:FLATPACK
页面大小:128 words并行/串行:PARALLEL
就绪/忙碌:YES座面最大高度:10.6426 mm
最大待机电流:0.00064 A最大压摆率:0.25 mA
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子形式:FLAT端子节距:0.635 mm
端子位置:DUAL切换位:NO
宽度:22.7838 mm最长写入周期时间 (tWC):10 ms
写保护:HARDWARE/SOFTWAREBase Number Matches:1

79C2040BRT4RFK-15 数据手册

 浏览型号79C2040BRT4RFK-15的Datasheet PDF文件第2页浏览型号79C2040BRT4RFK-15的Datasheet PDF文件第3页浏览型号79C2040BRT4RFK-15的Datasheet PDF文件第4页浏览型号79C2040BRT4RFK-15的Datasheet PDF文件第5页浏览型号79C2040BRT4RFK-15的Datasheet PDF文件第6页浏览型号79C2040BRT4RFK-15的Datasheet PDF文件第7页 
79C2040B  
20 Megabit (512K x 40-Bit)  
EEPROM MCM  
Logic Diagram  
DESCRIPTION:  
FEATURES:  
Maxwell Technologies’ 79C2040B multi-chip module (MCM)  
memory features a greater than 100 krad (Si) total dose toler-  
ance, dependent upon orbit. Using Maxwell Technologies’ pat-  
ented radiation-hardened RAD-PAK® MCM packaging  
technology, the 79C2040B is the first radiation-hardened 20  
megabit MCM EEPROM for space application. The 79C2040B  
uses twenty 1 Megabit high speed CMOS die to yield a 20  
megabit product. The 79C2040B is capable of in-system elec-  
trical byte and page programmability. It has a 128 word page  
programming function to make the erase and write operations  
faster. It also features Data Polling and a Ready/Busy signal to  
indicate the completion of erase and programming operations.  
In the 79C2040B, hardware data protection is provided with  
the RES pin, in addition to noise protection on the WE signal  
and write inhibit on power on and off. Software data protection  
is implemented using the JEDEC optional standard algorithm.  
512k x 40-bit EEPROM MCM  
RAD-PAK® radiation-hardened against natural  
space radiation  
Total dose hardness:  
- >100 krad (Si)  
- Dependent upon orbit  
Excellent Single event effects @ 25°C  
- SELTH > 120 MeV cm2/mg (Device)  
- SEUTH > 90 MeV cm2/mg(Memory Cells)  
- SEU TH > 18 MeV cm2/mg (Write Mode)  
- SETTH > 40 MeV cm2/mg (Read Mode)  
High endurance  
- 10,000 cycles/byte (Page Programming Mode)  
- 10 year data retention  
Page Write Mode: 128 Dword Page  
High Speed:  
Maxwell Technologies' patented RAD-PAK® packaging technol-  
ogy incorporates radiation shielding in the microcircuit pack-  
age. It eliminates the need for box shielding while providing  
the required radiation shielding for a lifetime in orbit or space  
mission. In a GEO orbit, RAD-PAK® provides greater than 100  
krad (Si) radiation dose tolerance. This product is available  
with screening up to Maxwell Technologies’ self-defined Class  
K
- 150 and 200 ns maximum access times  
Automatic programming  
- 10 ms automatic Page/Dword write  
Low power dissipation  
- 375 mW/MHz active current  
- 3. 2 mW standby current  
09.15.15 Rev 4  
1
All data sheets are subject to change without notice  
(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com  
©2015 Maxwell Technologies  
All rights reserved.